Tootfinder

Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
Jos\'e Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park, Kieran Spruce, Patrick See, Neil Curson, Taylor Stock, Peter Grutter
https://arxiv.org/abs/2403.13935

Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron charging events with high spatial resolution, at low temperature. In this work, we introduce a novel Atomic Force Microscope (AFM) instrument capable of measuring critical device dimensions, surface roughness, electrical surface potential, and ultimately the energy levels of quantum dots and single electron transistors in…